TEM specimen preparation: ion etcher (Balzers), dimpler (Gatan model 656)
Cutting by US: GATAN model 601
Slag swelling equipment Steukers Technique H3CR
SEM specimen preparation: BAL-TEC MED010 and MED020 evaporators
Gas pycnometer: Accupyc 1330 Micromeritics
US defects detector: Krautkramer type USD10 NF allowing to work in transmission or echo mode and working in the range of the lower frequencies (about 10 kHz) and the medium frequencies (up to
2 Mhz)
Two scanning electron microscopes (SEM) and microprobe : JEOL 5900-LV, EDX and WDX devices for chemical analyses (magnification up to 300 000x) and JEOL GSM 6100, EDX device (magnification up to 100 000x – limits of detection: from boron (under specific conditions) to uranium)
X-ray diffraction: Philips PW 1729; BRUKER D8 Advance, high temperature unit up to 2000°C for nitrides and carbides and 1400°C for other materials, detector PSD
Laser light scattering method: Mastersizer MalvernD; Mastersizer Malvern 2000 (grain size ranging from 0.02 μm to 2000 μm) under wet or dry conditions
Gamma-densimeter (fast and direct density measurement of materials on site)
Software for qualitative and semi-quantitative mineralogical analysis (internal development) from XRD spectra; Göbel mirror for irregularly shaped sample surfaces
Microstructural analysis software (size distribution of the grains, agglomerates) from digitalised images (internal development)
Specific surface area: Sorptomatic 1900 Carlo-Erba
